Atomic Force Microscopy (AFM) is a high-resolution scanning probe technique used to image, measure and manipulate matter at the nanoscale. AFM provides 3D surface topography with sub-nanometer resolution without requiring vacuum conditions or special sample preparation. It is widely used in materials science, life sciences, polymer research and nanotechnology for characterizing surface morphology, mechanical properties, electrical properties and molecular interactions.
A microfabricated cantilever with a sharp tip is scanned across the sample surface. Forces between the tip and the surface cause the cantilever to deflect. A laser beam reflected from the cantilever onto a position-sensitive detector measures these deflections with sub-nanometer precision. A feedback loop maintains constant force or oscillation amplitude, and the resulting feedback signal reconstructs a three-dimensional topography map. Advanced modes simultaneously map mechanical, electrical and magnetic properties alongside topography.
A comprehensive suite of surface, electrochemical, and structural characterization instruments enables materials scientists to understand, optimize, and validate the properties
High-sensitivity surface and thin-film characterization instruments are essential for semiconductor wafer processing, yield optimization, and failure analysis at the nanoscale.
