The Nanosurf CoreAFM is a compact research AFM with a 110×110 um scanner and full multi-mode capability including contact, AM-AFM, MFM, KPFM, and nanomechanics, suitable for both academic research and industrial quality control.
The Nanosurf CoreAFM is a compact, fully-featured research atomic force microscope combining broad mode coverage with a small footprint, making it suitable for labs where space is at a premium but full research capability is required.
Scanner and mechanics:
– XY scan range: 110×110 um (closed loop); Z range: 22 um
– Closed-loop XY and Z scanner: quantitative, calibrated measurements without piezo creep
– Compact scan head: fits into vacuum chambers and environmental enclosures
– Sample stage: up to 90 mm diameter samples
Imaging and measurement modes:
– Contact: topography, lateral force (LFM), friction mapping
– AM-AFM (tapping): topography and phase imaging in air and liquid
– Force spectroscopy: force-distance curves, force maps, adhesion, Young’s modulus
– MFM: magnetic domain imaging; two-pass interleave
– EFM and KPFM: surface potential mapping, work function imaging
– PFM: piezoresponse force microscopy for ferroelectric domains
– Conductive AFM (C-AFM): local current maps simultaneous with topography
Electrical measurement options:
– Lock-in amplifier: dual-frequency, phase-sensitive detection for PFM and EFM
– Bias spectroscopy: local I-V curves on semiconductor and dielectric surfaces
NewRoad provides Nanosurf CoreAFM in Israel with installation, training, and service support.
Nanosurf (Switzerland) - atomic force microscopes
110x110 um (closed loop)
22 um (closed loop)
Up to 90 mm diameter
Contact, AM-AFM, MFM, EFM, KPFM, PFM, C-AFM, force spectroscopy
Mangetic domains, surface potential, ferroelectrics, semiconductor, 2D materials
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