The Nanosurf NaioAFM is an ultra-compact entry-level atomic force microscope with a 100×100 um scanner, contact and AM-AFM modes, operating in air and designed for teaching, routine characterization, and introductory nanoscale research.
The Nanosurf NaioAFM is the most compact Nanosurf AFM, designed for routine nanoscale surface characterization, introductory research, and teaching applications where simplicity and ease of use are the primary requirements.
Design and mechanics:
– Ultra-compact form factor: 15x15x20 cm; weighs only 5 kg
– XY scan range: 100×100 um (open loop); Z range: 10 um
– Integrated cantilever holder and optical beam deflection detection
– USB connection to PC; no separate controller required
– Vibration isolation: passive isolation table recommended; not required for rougher samples
Operating modes:
– Contact mode: topography and lateral force imaging
– AM-AFM (tapping): topography and phase in air
– Force spectroscopy: force-distance curves on any point; adhesion measurements
– Static force mode: contact force control for fragile samples
Workflow and software:
– Nanosurf Naio software: guided workflow; wizard-based cantilever approach; real-time imaging
– Automated approach: press one button; system finds surface and starts imaging
– Data export: NANOSURFACE at format, ASCII, TIFF; compatible with Gwyddion and other analysis software
Applications: polymer film topography, cell roughness, nanoparticle sizing, surface texture, teaching AFM principles to students.
NewRoad provides Nanosurf NaioAFM in Israel for teaching labs, routine QC, and entry-level nanoscale research.
Nanosurf (Switzerland) - atomic force microscopes
100x100 um (open loop)
10 um
15x15x20 cm; 5 kg; USB to PC
Contact, AM-AFM (tapping), force spectroscopy
Teaching, polymer films, nanoparticle sizing, cell surface roughness, routine QC
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