The Molecular Vista Vista 75 is a tabletop Photo-induced Force Microscopy (PiFM) system providing simultaneous AFM topography and infrared chemical mapping at 10 nm spatial resolution for nanoscale chemical characterization of polymers, 2D materials, and semiconductor interfaces.
The Vista 75 from Molecular Vista is a compact benchtop PiFM (Photo-induced Force Microscopy) instrument that simultaneously acquires AFM topography and infrared chemical imaging at nanometer spatial resolution, far beyond the diffraction limit of conventional IR microscopy.
PiFM principle:
– IR laser illuminates the tip-sample junction
– IR absorption induces photoinduced forces at the nanoscale
– AFM cantilever detects these forces at mechanical resonance
– Result: IR spectra and chemical maps with ~10 nm resolution
Spectral capabilities:
– Range: 500-4000 cm-1 (full mid-IR fingerprint region)
– Compatible with OPO and QCL laser sources
– Hyperspectral: point spectra or full wavenumber chemical maps
– Detects monolayers and sub-10 nm domains
Sample types:
– Polymer blends and multilayer films (domain mapping)
– 2D materials: graphene, MoS2, h-BN
– Semiconductor nanowires and quantum dots
– Biological membranes and protein aggregates
– Pharmaceutical API distribution
Instrument:
– Benchtop: fits on standard optical or vibration isolation table
– Inverted geometry: bottom illumination through transparent substrate
– Atmosphere: ambient, N2 purge, or controlled environment
NewRoad provides Molecular Vista Vista 75 in Israel.
Molecular Vista (USA) - PiFM nano-IR systems
Photo-induced Force Microscopy (PiFM); IR nanospectroscopy
~10 nm (independent of IR wavelength)
500-4000 cm-1 (mid-IR fingerprint region)
Tapping mode; phase; amplitude; simultaneous with PiFM
Benchtop; inverted geometry; ambient or N2 environment
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