UV-Vis and Near-Infrared (NIR) Spectroscopy measure the absorption and transmission of light across the ultraviolet, visible and near-infrared wavelength ranges. These techniques identify and quantify chemical compounds based on their unique spectral signatures. They are widely applied in quality control, pharmaceutical analysis, environmental monitoring, food safety, chemical research and materials characterization, offering fast, non-destructive and highly accurate results.
A light source (deuterium lamp for UV, tungsten-halogen for visible and NIR) illuminates the sample through optical fibers or in a cuvette. The transmitted or reflected light is dispersed by a diffraction grating onto a CCD or InGaAs array detector, generating a spectrum of intensity versus wavelength in milliseconds. In absorbance mode, the spectrum of a sample is compared to a blank reference to calculate absorbance using the Beer-Lambert law. In reflectance mode, the spectrum reveals surface color, gloss and coating properties.
A comprehensive suite of surface, electrochemical, and structural characterization instruments enables materials scientists to understand, optimize, and validate the properties
High-sensitivity surface and thin-film characterization instruments are essential for semiconductor wafer processing, yield optimization, and failure analysis at the nanoscale.
