Theta Wafer

Premium optical tensiometer for fully automated contact angle measurements on silicon wafers.

The Attension® Theta Wafer from Biolin Scientific is a highly accurate, automated system built to simplify repetitive contact angle measurements on silicon wafers. It supports wafer sizes from 2″ up to 12″ and collects wettability data across the entire wafer surface, ensuring repeatable analysis for semiconductor research and manufacturing facilities. Developed for the electronics industry, it is fully automated and characterizes surface cleanliness and homogeneity across the wafer.

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about this product

Premium optical tensiometer for fully automated contact angle measurements on silicon wafers.

What you can measure
Measurement	Method
Static contact angle	Sessile drop, captive bubble and meniscus
Dynamic contact angle	Advancing and receding contact angle, contact angle hysteresis, roll off angle
Surface free energy	Sessile drop, captive bubble and meniscus
Surface and interfacial tension	Pendant drop and reverse pendant drop
Batch contact angle	Batch sessile drop, for quality control

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WHY CHOOSE THIS PRODUCT

Three reasons to invest

Automation at an all time high. Camera autofocus keeps the image sharp at all times, automatic surface mapping moves the sample between measurement positions, and the industry leading OneAttension software generates results automatically. Together these simplify the measurement and raise accuracy.
Accuracy and user independence. A 5 MP camera, image enhancement through DropletPlus technology, and built in sensors that monitor the surrounding environment for full traceability. Reliable data is the foundation of measurements that do not depend on who runs them.
Easy to use with an integrated touch display. Everything from filling the liquids to changing the sample is handled directly at the instrument in seconds, making measurement preparation far smoother.

Specifications & Performance

Measuring range (°, mN/m)

0...180, 0.01...2000

Accuracy (°, mN/m)

± 0.1, ± 0.01

Maximum resolution (pixels)

2592 x 2048 (5 MP)

Stage movement

Motorized XYZ

Maximum measuring speed (fps)

3422

Image focusing

Software-controlled autofocus, manual fine focus in optics

Software

OneAttension, includes all measurement modes

Compatible Add-Ons

No data was found

ADDITIONAL INFORMATION

explore applications

Electrochemistry

Energy

Advanced electrochemical and surface characterization tools accelerate research and development of batteries, fuel cells, supercapacitors, and photovoltaic systems.

Material Science

Materials Science

A comprehensive suite of surface, electrochemical, and structural characterization instruments enables materials scientists to understand, optimize, and validate the properties of advanced materials.

Nanotechnology

Semiconductors

High-sensitivity surface and thin-film characterization instruments are essential for semiconductor wafer processing, yield optimization, and failure analysis at the nanoscale.

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