Transmission Electron Microscopy (TEM) is an imaging technique that passes an electron beam through an ultra-thin specimen to reveal internal structure at atomic resolution. TEM enables visualization of nanoparticles, crystal structures, lattice defects and biological ultrastructure at magnifications exceeding 500,000x. It is essential in materials science, semiconductor research, nanotechnology and life sciences.
A beam of electrons accelerated to 5–25 kV is transmitted through an ultra-thin specimen. As electrons interact with the sample, they are scattered by atomic nuclei and electron clouds. The transmitted and diffracted electrons are focused by electromagnetic lenses to form a magnified image on a detector or fluorescent screen. Contrast in the image arises from differences in atomic number, density and crystal orientation within the sample, revealing internal structure at nanometer to sub-nanometer resolution.
A comprehensive suite of surface, electrochemical, and structural characterization instruments enables materials scientists to understand, optimize, and validate the properties
Surface science and nanoscale measurement instruments support life science researchers in studying biomolecular interactions, cell adhesion, and membrane behavior with
