The Delong LVEM 25E is a 25 kV variable-voltage bench-top electron microscope with 1 nm TEM and 3 nm SEM resolution, combining TEM, SEM, STEM, and ED modes for biological, polymer, and nanomaterials imaging.
The Delong LVEM 25E extends the LVEM platform to 25 kV, improving resolution over the LVEM 5 while maintaining bench-top size and the high-contrast advantage of low-voltage operation.
Operating modes:
– TEM: bright-field; 1 nm resolution at 25 kV
– SEM: surface imaging; 3 nm resolution at 25 kV
– STEM: dark-field for nanoparticle characterization
– ED: electron diffraction for phase identification
Versus LVEM 5:
– TEM resolution: 1 nm vs 2 nm; SEM resolution: 3 nm vs 10 nm
– Thicker sections: up to 200 nm versus 100 nm for LVEM 5
– Variable voltage 10-25 kV for contrast vs. resolution optimization
– Still provides higher contrast than conventional 100-300 kV TEM
Specifications:
– Accelerating voltage: 10-25 kV (variable)
– TEM resolution: 1 nm; SEM resolution: 3 nm
– Magnification: 1,000-500,000x TEM; 200-100,000x SEM
– Footprint: 50×60 cm; weight: 80 kg
– Vacuum: integrated turbo pump
– Camera: 11 MP cooled CCD; USB3
– Power: 110-240 V; 2 kVA
Applications: cell ultrastructure, polymer blends, nanoparticle analysis, pharmaceutical formulations, semiconductor failure analysis.
NewRoad provides Delong LVEM 25E in Israel with installation, training, and maintenance contracts.
Delong (Czech Republic) - low voltage electron microscopes
10-25 kV (variable)
1 nm TEM; 3 nm SEM
1,000-500,000x TEM; 200-100,000x SEM
50x60 cm bench-top; weight 80 kg
Cell ultrastructure, polymer morphology, nanoparticles, pharmaceuticals, semiconductor analysis
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