Smart SE

The HORIBA Smart SE is a compact, bench-top spectroscopic ellipsometer that delivers fast and accurate thin film characterization in a form factor optimized for everyday laboratory use, education, and light quality control applications. Like the rest of HORIBA’s SE product line, the Smart SE measures the polarization change of reflected light to determine thin film thickness and optical constants (n, k) simultaneously without requiring a separate reflectance measurement or contact with the sample. The instrument uses a rotating-analyzer optical configuration with a spectrographic CCD detector, providing spectral ellipsometry data across the visible range in a single, fast measurement. The Smart SE is designed for straightforward operation: samples are loaded on the stage, measured, and results are displayed in seconds using pre-configured measurement recipes for common thin film materials (silicon dioxide, silicon nitride, photoresist, organic films, and more). The compact form factor and low weight make the Smart SE suitable for placement on any laboratory bench, in clean room environments, and even for field use where a portable measurement system is needed. The instrument is particularly well suited for university teaching laboratories, materials science research groups working with thin films, and industrial settings where periodic process monitoring of a known film system is required. Smart SE software guides users through measurement and analysis workflows with a straightforward interface. NewRoad provides the HORIBA Smart SE in Israel for universities, thin film deposition laboratories, photovoltaics research, and industrial QC groups requiring routine, accurate ellipsometric characterization.