X-5000

The HORIBA X-5000 is a benchtop wavelength-dispersive X-ray fluorescence (WDXRF) spectrometer designed for gigh-precision elemental analysis where superior spectral resolution and detection limits are required compared to energy-dispersive instruments. In wavelength-dispersive XRF, the fluorescence X-rays from the sample are diffracted by an analyzing crystal before reaching the detector: the crystal disperses X-rays by wavelength (analogous to a monochromator for light), allowing the instrument to select and measure specific elemental lines with very high spectral resolution, eliminating peak overlaps that can complicate EDXRF analysis of complex matrices. This makes WDXRF the technique of choice for challenging applications such as trace element determination in steel and non-ferrous alloys, major and minor element analysis in cements and geological materials, light element analysis (Be, B, C, N, O, F, Na, Mg), and regulatory-compliance analysis of coatings and polymers at ppm levels. The X-5000 is a sequential spectrometer (scanning goniometer) that measures elements one at a time by scanning the analyzing crystal angle, covering the full elemental range from Be (Z=4) to U (Z=92) with a single instrument configuration. It is equipped with a high-power X-ray tube (Rh or other target) and a flow proportional counter plus scintillation detector combination for efficient detection across the full wavelength range. The system supports solid samples, fused beads, pressed pellets, and liquids, and includes comprehensive quantitative analysis software with fundamental parameters and empirical calibration capabilities. NewRoad provides the HORIBA X-5000 in Israel for steel mills, cement laboratories, geological survey institutions, and research laboratories requiring high-accuracy multi-element XRF analysis.