The HORIBA Mesa-50 is a benchtop energy-dispersive X-ray fluorescence (EDXRF) spectrometer for rapid, non-destructive elemental analysis of solids and liquids, covering Na to U for environmental, industrial, and quality control applications.
The HORIBA Mesa-50 is a benchtop energy-dispersive X-ray fluorescence (EDXRF) spectrometer designed for fast, reliable, and non-destructive elemental analysis across a broad range of sample types and industrial applications. EDXRF is a well-established technique in which a sample is irradiated with X-rays, exciting characteristic fluorescence radiation from the elements present; the energies and intensities of the emitted fluorescence X-rays are measured by a solid-state detector, yielding elemental identification and quantification without any wet chemistry or sample dissolution. The Mesa-50 is equipped with a 50 W rhodium-target X-ray tube and a silicon drift detector (SDD) for high count rate and excellent energy resolution, enabling simultaneous detection of elements from sodium (Na, Z=11) to uranium (U, Z=92). The instrument is suitable for solid samples (pressed pellets, loose powders, metals, polymers), liquid samples (oils, solutions), and thin films. In industrial quality control, the Mesa-50 is widely used for RoHS/WEEE hazardous substance screening (Pb, Hg, Cd, Cr, Br), coating thickness and composition measurement (galvanic coatings, paint layers), elemental assay of ores and geological samples, and incoming material inspection in manufacturing. A user-friendly software interface with built-in calibration curves and fundamental parameters quantification enables straightforward operation by non-specialist users. The compact footprint and integrated safety design make the Mesa-50 well-suited for laboratory and production floor environments. NewRoad provides the HORIBA Mesa-50 in Israel for environmental compliance testing, metals and materials QC, and research applications requiring rapid elemental screening.
Energy-dispersive X-ray fluorescence (EDXRF)
50 W, Rh target
Silicon drift detector (SDD)
Na (Z=11) to U (Z=92)
RoHS/WEEE screening, coating thickness, geology, metals QC, oil analysis
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