PRODUCTS

XGT 9000

The HORIBA XGT-9000 is an X-ray analytical microscope combining micro-XRF elemental analysis with X-ray transmission imaging, enabling simultaneous compositional and structural characterization of heterogeneous samples with ~10 µm spatial resolution.

overview

about this product

The HORIBA XGT-9000 is a flagship X-ray analytical microscope that uniquely combines micro-focus X-ray fluorescence (micro-XRF) elemental analysis with X-ray transmission imaging in a single benchtop instrument. At the heart of the XGT-9000 is HORIBA’s proprietary X-ray Guide Tube (XGT) optics technology: a hollow glass capillary tube that guides and focuses X-rays to a fine spot (as small as 10 µm or 100 µm selectable) without relying on pinhole collimators, delivering high X-ray flux at the sample and enabling rapid elemental mapping even at trace concentrations. The simultaneous X-ray transmission image allows the user to observe the internal structure of the sample (analogous to a miniature X-ray radiograph) while acquiring elemental distribution maps, making it possible to correlate structural features with chemical composition at the microscale. The XGT-9000 can map 2D elemental distributions across a sample area by raster-scanning the focused X-ray beam and collecting the characteristic XRF signal at each pixel, generating false-color elemental maps that reveal the spatial distribution of multiple elements simultaneously. The system operates over the elemental range from Na (Z=11) to U (Z=92) in a single measurement, without the need to change detectors or conditions. The benchtop design and large sample chamber accommodate a wide variety of sample types: printed circuit boards and electronic components for failure analysis and RoHS screening, heterogeneous geological samples and minerals for phase identification, artworks and cultural heritage objects for pigment mapping, polymers and composites for contaminant identification, and pharmaceutical tablets for coating uniformity. Quantitative analysis using fundamental parameters or standard curves provides elemental concentrations across the mapped area. NewRoad provides the HORIBA XGT-9000 in Israel for electronics failure analysis, environmental compliance, and materials science research.

WHY CHOOSE THIS PRODUCT

Simultaneous micro-XRF elemental mapping and X-ray transmission imaging in one instrument Proprietary XGT optics: 10 µm and 100 µm spot sizes with high X-ray flux for rapid mapping Full elemental range Na–U in a single measurement without detector changes Non-destructive analysis of electronics, geological samples, artworks, and composites Benchtop design with large sample chamber for versatile sample accommodation

Specifications & Performance

Technique

Micro-XRF (X-ray fluorescence) + X-ray transmission imaging

X-ray optics

HORIBA XGT (X-ray Guide Tube) capillary optics

Spot size

10 µm and 100 µm (selectable)

Elemental range

Na (Z=11) to U (Z=92)

Applications

Electronics failure analysis, RoHS/WEEE, geology, art, contaminant identification

Compatible Add-Ons

No data was found

ADDITIONAL INFORMATION

explore applications

Experiments in the laboratory | NewRoad

Spectroscopy

Chemistry & Biochemistry

Versatile analytical and surface characterization instruments support fundamental and applied research in molecular chemistry, reaction kinetics, colloid science, and biomolecular analysis.

Science background wallpaper, petri dishes flat lay | NewRoad

Material Science

Materials Science

A comprehensive suite of surface, electrochemical, and structural characterization instruments enables materials scientists to understand, optimize, and validate the properties of advanced materials.

Smart microchip background on a motherboard closeup technology r | NewRoad

Nanotechnology

Semiconductors

High-sensitivity surface and thin-film characterization instruments are essential for semiconductor wafer processing, yield optimization, and failure analysis at the nanoscale.

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