TRIOS

The HORIBA TRIOS is an atomic force microscope (AFM) platform designed for high-resolution surface topography and property mapping with integrated optical access, enabling correlative AFM and optical or spectroscopic measurements from the same sample area. The TRIOS is part of HORIBA’s scanning probe microscopy product family, providing quantitative nanoscale characterization of surface morphology, mechanical properties, electrical properties, and magnetic properties through a range of AFM measurement modes. The system supports standard contact, non-contact, and tapping mode AFM for surface topography, as well as advanced modes including phase imaging for compositional contrast, force-distance spectroscopy for local mechanical measurement (Young’s modulus, adhesion), and conductive AFM (C-AFM) for local conductivity mapping. The TRIOS’s integrated optical access allows combination of AFM imaging with optical microscopy for sample navigation, photoluminescence mapping, or Raman spectroscopy correlation – enabling simultaneous or sequential characterization of the same sample feature at the nanoscale. This correlative capability is particularly valuable for materials science applications where the relationship between nanoscale topography and optical, electrical, or chemical properties needs to be understood: for example, mapping grain boundaries in perovskite solar cells, characterizing 2D material flakes (graphene, MoS2), or imaging nanoparticle-cell interactions. The TRIOS is designed for academic and industrial research environments requiring advanced multimodal nanoscale characterization beyond simple topography imaging. NewRoad provides the HORIBA TRIOS in Israel for materials science, nanotechnology, and surface science research laboratories.