LensAFM

Nanosurf AFM Probes are cantilever tips matched to Nanosurf AFM platforms (DriveAFM, FlexAFM, CoreAFM, NaioAFM) for specific imaging modes and sample types.

Contact mode probes:
– Silicon nitride cantilevers: spring constant 0.06-0.5 N/m; tip radius <10 nm; for soft biological samples - Silicon cantilevers: spring constant 1-5 N/m; for hard material contact imaging and force spectroscopy - Diamond-coated: wear-resistant; for repeated contact on hard surfaces (ceramics, metals) AM-AFM (tapping) probes: - Standard silicon: resonance 75-300 kHz; spring constant 2-40 N/m; universal tapping probe - Supersharp: tip radius <2 nm; for high-resolution polymer and thin film imaging - Long-range: resonance 50-75 kHz; softer spring constant; for biological tapping in liquid Electrical mode probes: - Conductive (PtIr or Cr/Au coated): for C-AFM, KPFM, EFM; tip radius 20-30 nm coated - MFM probes: CoCr magnetic coating; lift height 50-200 nm; hard disk, magnetic nanoparticle imaging - PFM probes: stiff silicon with PtIr coating; for ferroelectric domain writing and imaging Calibration: - Certified spring constant: traceable to national metrology standards - Tip radius certified by SEM: contact and tapping probes - Resonance frequency measured and supplied on data sheet NewRoad provides Nanosurf AFM probes in Israel with same-day quotation for standard types.