The Nanosurf Naio Tip & Sample Changer is an automated accessory for the NaioAFM that enables rapid cantilever and sample exchange without manual alignment, reducing downtime in high-throughput surface characterization workflows.
The Nanosurf Naio Tip and Sample Changer is a motorized accessory for the NaioAFM platform that automates cantilever exchange and sample positioning, enabling high-throughput surface characterization with minimal user intervention.
Automated cantilever exchange:
– Motorized cantilever holder exchange: swap cantilever holders in under 60 seconds
– No manual laser alignment after exchange: system re-centers detection laser automatically
– Compatible with all standard cantilever holders: contact, AM-AFM tapping, and force spectroscopy holders
– Cantilever library: up to 6 pre-loaded holders ready for automated sequential measurement
Automated sample handling:
– XY motorized sample stage: 25×25 mm travel; 1 um step resolution
– Sample queue: program measurement locations; NaioAFM images each location sequentially
– Compatible with standard 15 mm diameter sample stubs and 1×1 inch sample holders
– Z approach: automated for each new sample position
Software integration:
– Nanosurf automation script: define tip, sample, and measurement parameters; run overnight
– Python API: full control from custom scripts for integration with laboratory information systems
– Data organization: each measurement saved with tip ID, sample position, and time stamp
Applications: polymer film quality control, nanoparticle batch characterization, pharmaceutical tablet coating roughness screening.
NewRoad provides the Nanosurf Naio Tip and Sample Changer in Israel as an add-on to the NaioAFM.
Nanosurf (Switzerland) - AFM accessories
Up to 6 pre-loaded; automated exchange <60 s; auto laser re-centering
XY motorized; 25x25 mm travel; 1 um step; automated approach
NaioAFM
Nanosurf automation scripts + Python API; data with tip/sample/time metadata
Polymer QC, nanoparticle screening, pharmaceutical coating roughness, batch characterization
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