The Molecular Vista SignatureSPM is a scanning probe microscope that delivers simultaneous AFM and nanoscale IR/Raman spectroscopy via Photo-induced Force Microscopy (PiFM), providing chemical imaging with approximately 10 nm spatial resolution — far below the optical diffraction limit — for materials characterization at the nanoscale.
The Molecular Vista SignatureSPM is an advanced scanning probe microscopy platform built around Photo-induced Force Microscopy (PiFM), a proprietary technique that enables simultaneous atomic force microscopy (AFM) topography mapping and infrared or Raman nanospectroscopy at a spatial resolution of approximately 10 nm. By detecting photoinduced force between a sharp AFM tip and the sample surface, PiFM achieves chemical identification and mapping entirely independent of the optical diffraction limit, accessing length scales inaccessible to conventional confocal Raman or FTIR microscopy.
In PiFM mode, an infrared or Raman laser is focused at the tip-sample junction. The electromagnetic field enhancement at the sharp metallic tip drives a photoinduced force that is detected by the AFM cantilever. Because the measurement is force-based rather than photon-based, the spatial resolution is determined by the tip radius (typically 10–20 nm) rather than the wavelength of light. This allows the SignatureSPM to generate full IR or Raman spectra and 2D chemical maps at true nanoscale resolution from a single acquisition, with spectral quality sufficient for chemical identification and library matching.
The SignatureSPM integrates seamlessly with HORIBA Raman excitation sources and spectrographs, providing a complete Nano-Raman/PiFM solution. A key advantage of PiFM over tip-enhanced Raman spectroscopy (TERS) is that it works in ambient conditions without requiring complex tip preparation or vacuum, making it significantly more accessible for routine laboratory use. Samples can be measured in air at room temperature, and the non-contact, non-destructive nature of the measurement preserves delicate soft materials including polymers, biological specimens, and organic thin films.
Typical applications include nanoscale morphology and chemical domain mapping in block copolymers and polymer blends, identification of contaminants and inclusions in semiconductor or electronic materials, characterization of 2D materials and heterostructures at the flake level, protein aggregation and biological membrane studies, and nanoscale defect analysis in organic photovoltaics. NewRoad provides the Molecular Vista SignatureSPM in Israel for materials science, semiconductor, and life science research groups requiring nanoscale chemical imaging beyond the optical diffraction limit.
Scanning probe microscope with integrated Photo-induced Force Microscopy (PiFM) for nanoscale IR and Raman spectroscopy
~10 nm chemical imaging spatial resolution — far below the optical diffraction limit
PiFM: force-based detection of photoinduced tip-sample interaction; simultaneous AFM topography and chemical mapping
Ambient conditions (air, room temperature); non-contact, non-destructive; no vacuum or special tip preparation required
Polymer nanomorphology, semiconductor defects, 2D materials, biological membranes, organic photovoltaics, nanoscale contaminants
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