Optosigma Piezo Stages are nanometer-resolution positioning stages using piezoelectric actuators with closed-loop capacitive or strain gauge feedback, providing sub-nanometer repeatability for AFM sample scanning, fiber alignment, and active beam stabilization.
Optosigma Piezo Stages are precision nanopositioning systems that use piezoelectric crystal stacks to achieve nanometer-level displacement resolution and repeatability. They are used where micrometer-scale motion from stepper or servo motor stages is insufficient.
Actuation principle:
– Piezoelectric stacks: applied voltage causes dimensional change in piezoelectric crystal; 100-200 V drive voltage produces 10-100 um travel range
– Hysteresis: raw piezo exhibits 10-20% hysteresis; closed-loop operation eliminates hysteresis
Closed-loop operation:
– Capacitive sensors: measure actual displacement non-contact; resolution below 0.1 nm
– Strain gauge sensors: embedded sensors measuring piezo deformation; lower cost than capacitive
– Feedback controller: servo loop maintains commanded position against drift, creep, and external forces
Stage configurations:
– Single-axis piezo stage: 10-100 um travel; sub-nanometer resolution
– Multi-axis (XYZ) piezo stages: three independent piezo axes in one compact unit
– Tip-tilt (angular) piezo: for laser beam steering with nanoradian angular resolution
– Piezo with flexure guide: frictionless flexure mechanism eliminates stick-slip; better than crossed roller for sub-100 nm resolution
Applications: AFM sample scanning, fiber-to-chip alignment, active beam stabilization, super-resolution microscopy.
NewRoad provides Optosigma piezo stages in Israel for AFM, nanoscale positioning, and precision fiber alignment.
Optosigma (Japan) - precision optomechanical equipment
10 um to 100 um per axis; piezoelectric stack drive at 100-200 V
Below 0.1 nm with closed-loop capacitive sensor feedback
Capacitive (highest resolution); strain gauge (embedded, cost-effective)
AFM sample scanning, fiber-to-chip alignment, active beam stabilization, super-resolution microscopy
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