Elemental Analyzer

FROM PRINCIPLE TO APPLICATION

In XRF, a primary X-ray beam irradiates the sample, ejecting inner-shell electrons from atoms. As outer-shell electrons fill the vacancies, they emit characteristic X-rays at element-specific energies detected by energy-dispersive or wavelength-dispersive detectors. In GD analysis, the sample serves as a cathode in a low-pressure argon plasma; ion bombardment sputters material layer by layer, and ablated atoms are analyzed by optical emission spectroscopy to produce quantitative depth profiles with nm-level depth resolution and ppm-level detection limits.